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SCANNING ELECTRON MICROSCOPE

By Joanne Gibson,2014-02-26 23:36
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SCANNING ELECTRON MICROSCOPE MANUFACTURER: HITACHI MODEL: S2300 APPLICATION: Scanning electron microscopy (SEM) is a method for high-resolution imaging of surfaces. The SEM uses electrons for imaging, as optical microscopes use visible light. The advantages of SEM over optical microscopy include greater magnification (u..

SCANNING ELECTRON MICROSCOPE

    MANUFACTURER: HITACHI

    MODEL: S2300

    APPLICATION:

    Scanning electron microscopy (SEM) is a method for high-resolution imaging of surfaces. The SEM uses electrons for imaging, as optical microscopes use visible light. The advantages of SEM over optical microscopy include greater magnification (up to 100,000x) and higher depth of field.

    An incident electron beam is raster-scanned across the sample's surface, and the resulting electrons emitted from the sample are collected to form an image of the surface. Imaging is typically obtained using secondary electrons for a

    better resolution of fine surface topographical features. Alternatively, imaging with backscattered electrons gives contrast based on atomic number, which

    solves microscopic composition variations, and gives topographical information.

    TECHNICAL SPECIFICATIONS:

    The main characteristics of the SEM HITACHI S2300 are:

    Resolution 4.5 nm. (x20 x200.000)

    Filament: Tungsten

    Accelerating Voltaje: 0.5-30 kV

    3 lens reduction system Electron optical system 2-stage electromagnetic deflection

    system

    Objective lens aperture: 0.1-0.4 mm

    X Traverse: 0 80 mm

    Y Traverse: 0 40 mm

    Tilt angle: -20º a 90º Specimen stage

    Work distance: 5 35 mm

    Rotation angle: 360º

    1 Oil difusión pump: 400l/sec

    1 Oil rotatory pump: 160/min Evacuating system

    P=10-5 Torr.

    Temperature: 15 30ºC

    Humidity < 70% Ambient conditions

    Vibration < 5 Hz

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