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IC TESTER REPORT

By Bertha Olson,2014-01-11 14:27
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IC TESTER REPORTIC,Ic,ic

    BY :-

     SUNIL RAINA

     PIYUSH SONAWANE

     PARIMAL

    SIKCHI

    Digital IC Tester

    CERTIFICATE

    PUNE VIDYARTHI GRIHA’S

    COLLEGE OF ENGINEERING AND TECHNOLOGY

    DEPARTNMENT OF ELECTRONICS & TELECOMMUNICATION

    ENGINEERING,

    ACADEMIC YEAR 2009-2010

    This is to certify that-

    Mr. SUNIL RAINA (T3073067)

    Mr. PIYUSH SONAWANE (T3073066)

    Mr. PARIMAL SIKCHI (T3073065)

    have satisfactorily carried out mini-project entitled “Digital IC Tester” in our premises under the

    guidance of Prof. N.P.DESHPANDE for the partial fulfillment of term-work in the subject “Electronic System Design And Mini Project” of third year in the Department of Electronics & Telecommunication Engineering.

    PROJECT EXTERNAL HEAD OF DEPT.

     GUIDE EXAMINAR E &

    TC

    TABLE OF CONTENTS

    Sr.?No.CONTENTSPage?No.

    1Abstract5

    2

    Digital IC Tester

    1Introduction to digital IC tester62Background8

    3Block Diagram10

    4Features of IC tester circuit105Technical Specifications115Introduction to LCD12

    6Introduction to KEYPAD13

    7IC tester circuit diagram148PCB Layouts15

    9Algorithm of program17

    10Flow chart18

    11Logic involved19

    12Code for IC testing20

    13Problems and Troubleshooting4014Conclusions42

    15Future Scope of Work43

    16Component list and their cost4417References46

    18Software used46

    ACKNOWLEDGEMENT

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    Digital IC Tester

     The completion of any project brings with it a sense of satisfaction, but it is never complete without thanking those people who made it possible and whose constant support has crowned our efforts with success.

     Deshpande, Head of the Department, Electronics We are thankful our guide, Prof. N.P.

    and Telecommunication PVG’s COET, PUNE, of Electronics and Telecommunication for

    his expert guidance, encouragement and valuable suggestions at every step.

    We would like to express our gratitude to Prof. R.G. Kaduskar, for encouraging and

     inspiring us to carry out the project in the department lab.

     We also would like to thank all the staff members and lab assistants of E&TC dept. for providing us with the all required facilities and support towards the completion of the project.

     We would also like to thank our seniors who always helped us to overcome our problems during the course of the project.

     We are extremely happy to acknowledge and express our sincere gratitude to our parents for their constant support and encouragement and last but not the least, friends and

    cooperation and solutions to problems during the course of the well wishers for their help and

    project.

    ABSTRACT

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    Digital IC Tester

     The digital IC tester is implemented by using the 89C51 microcontroller board. The processing of the inputs and outputs is done by the microcontroller. The display part on the microcontroller board is modeled using LCD. After the successful testing of the IC, the result is displayed on the LCD.

     The basic function of the digital IC tester is to test a digital IC for correct logical functioning as described in the truth table and/or function table. It can test digital ICs having a maximum of 24 pins. Since it is programmable, any number of ICs can be tested within the constraint of the memory available. This model applies the necessary signals to the inputs of the IC, monitoring the outputs at each stage and comparing them with the outputs in the truth table. Any discrepancy in the functioning of the IC results in a fail indication, displays the faulty and good gates on the LCD. The testing procedure is accomplished with the help of keys present on the main board.

     At this stage we had completed to test the most common used digital IC's used in our laboratories, mainly belonging to the 74TTL series and successfully completed writing assembly code for 10 IC’s. This tests various types of IC's like OR, XOR, NAND, AND, NOT, NOR, XNOR GATES and also FULL ADDER, MULTIPLEXER, SHIFT REGISTER.

    INTRODUCTION

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    Digital IC Tester

     In any manufacturing industry there are continuous efforts in cost reductions, upgrade quality and improve overall efficiencies. In electronic industry, with dramatic increase in circuit complexity and the need for the higher levels of reliability, a major contributor cost in any product can be in the testing. However we should recognize in the real world that no product is perfect, so that testing and in particular automatic testing will be an essential part of production in the foreseeable future.

     In industries, research centers and college, some common IC's are frequently used; many times people face problems due to some fault in these integrated circuits. So it is very essential to test them before actually using them in any of the applications. Microcontroller based digital IC tester is best solution for these problems.

     This project has the capability of testing any available digital IC of the TTL or CMOS family of 24 pins. The main advantage over the industry standard for the project is its low cost and eases of updating to any new IC design which may be inducted in the market by any company only through software updating.

     The IC-tester tests the basic logic gates used in the digital laboratory of colleges. It uses 89c51 as the controlling and processing unit. The keyboard and the display circuits are interfaced with the master microcontroller. The input is given to the corresponding pins of the IC to be tested using program stored in micro-controller acting as slave. The output is taken from the relevant pin. It is compared with the look-up table of that IC being stored in the memory. Depending on the result of comparison, the output is displayed in the LCD display.

     Microcontrollers have become ubiquitous in electronic applications.

    However the system supported by these devices has become exceedingly complex in terms of functionality and the quantity of peripheral components. In recent years the boundaries of such systems have stretched to include additional peripheral components marking the advent of system-on-chip(S o C). The motivation to develop such devices has been to increase

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    Digital IC Tester

    functionality and performance while reducing system cost, integrity complexity and power dissipation.

    BACKGROUND OF DIGITAL IC TESTER

     The digital IC tester is implemented in order to test the digital IC’s to verify the faulty gates and the good gates. The necessary inputs to the gates of the IC to be tested which is placed in the ZIF socket is received from the slave micro-controller IC and corresponding

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    Digital IC Tester

    outputs are accumulated and sent to the same controller IC where the output is compared with the functional or the logic table and if any discrepancy results, it displays the fail in the LCD display screen. Analog IC tester is also available in the market which was replaced by this digital IC tester which is more sophisticated by performing the tasks in a much easier fashion and the execution time also very fast in it

    The primary purpose of this digital IC tester is that it can easily check the IC within due course of time and if any discrepancy results then it determines the gates which were good ones and which were the bad ones. The manual operation or a human intervention includes testing of each individual IC by making necessary connections and verifying the outputs for each gate by the truth table is a time taking and tedious process.

    With the implementation of the micro controller units it makes the job much easier to receive data for the respective gates and process output and display results. The operation of a MCU based controller is determined primarily by its program.

    Microcontrollers are versatile. MCUs are very useful, since its approach is programmable, many additional features are possible at little or no added cost.

    And the main advantage of this circuit is that whenever a new IC is to be tested it does not include any addition of hardware but a slight updating in the software code is sufficient enough.

     The IC TESTER CIRCUIT is one among the many applications of the

    MICROCONTROLLER BOARD. The IC which is to be tested is mounted on the ZIF socket.

    The inputs are fed to the IC which is primarily processed through the slave controller board.

    The program is written in such a way that comparisons are to be made between the expected

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    Digital IC Tester

    data from the truth table and the data that is obtained from the data bus which is nothing but the outputs of the IC that is in testing process. Finally a display has to be made on the LCD display which is located in the main controller board specifying which gates of the IC are working and which are not.

    FEATURES OF IC TESTER

    1: User friendly set up and operates.

    2:16 X 2 character LCD display.

    3: Built in 2 functions and 10 numerical keys.

    4: Identifies over 10 CMOS / TTL digital ICs (up to16 pins).

    5: Various LED’S and LCD display to present the test results FAIL or PASS.

     TECHNICAL SPECIFICATIONS:

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    Digital IC TesterFAMILY : TTL, CMOS,

    RANGE : Logic Gates, Shift Register, Adder and Multiplexer can be tested.

    TEST SOCKETS : A single 24 pin ZIF sockets for IC Testing.PACKAGE : DIP14, 16, 20 and 24 pins.

    DISPLAY : 16X2 LCD Display.

INDICATOR LEDs: 4 bright LEDs of 3 mm each.

    KEY PAD : 4X3 MATRIX TYPE.

    ELECTRICAL : 230 V (+/- 10 %), 1 phase, 50 Hz (+/- 2 %)

    LCD

     The LCD in the board is 16X2 characters display.

    PIN DIAGRAM OF 16X2 LCD:

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