Paste Company Logo here Document: Equipment Assessment Paste Company Logo here Customer: Silian Optoelectronics Date: Paste Company Logo here
1 Equipment Details:
Equipment Vendor:Suzhou HZS-Nanosurf Nanotechnology Co.,Ltd
Model Number: Nanite AFM
Serial Number:
Manufactured Year:
Purchase Price:920,000(RMB)
Qualified Technical Assessment Expert: Title:
Name:
2 Technical Parameters by Equipment Vendor resolution？
XY？0.15 nm
Z？0.027 nm;10 μm scan head；
XY？1.7 nm
Z resolution？0.34 nm;110 μm scan head；
Features and parameters？
size？unlimited
Xy scan range？10 μm×10 μm？optional 110μm
Z range？2.0μm;correspoding is XY-110 μm Zrange is 22 μm；
Xy linearity mean error？<0.6%
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Paste Company Logo here Document: Equipment Assessment Paste Company Logo here Customer: Silian Optoelectronics Date: Paste Company Logo here
Z measurement noise level？contact mode ？0.07 nm;the maximum is 0.2 nm；
Dynamic mode？0.04 nm;the maximum is 0.07nm；
Scan direction？0 -360?
The way of approaching？automatic approach
The range of approaching ？4.5 mm
The range of frequency in dynamic mode: 15-300 KHz;resolution<0.1 Hz；
The sampling point？2048*2048
Alignment of cantilevel:Automatic self-adjustment Colorful camera(optional)optical resolution: 3μm
3 Detailed Report on Equipment
Component Assessment of Damage Replacement Why Replacement?
(Thermal, Water, Ash) Required? (Effect Accuracy, Effect Specification, Effect
(Y/N) Function, Effect Throughput, Destroyed) BT03332 Y Because of being grilled by the higher
temperature？ the accuracy is not be ensured. BT02708 Y Because of being grilled by the higher
temperature？ the accuracy is not be ensured. BT02706 Y Because of being grilled by the higher
temperature？ the accuracy is not be ensured. BT04634 Y Because of being grilled by the higher
temperature？ the accuracy is not be ensured. BT02753 Y Because of being grilled and fumed ？the
accuracy is not be ensured.
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Paste Company Logo here Document: Equipment Assessment Paste Company Logo here Customer: Silian Optoelectronics Date: Paste Company Logo here
BT01900 Y Because of being grilled and fumed ？the
accuracy is not be ensured.
BT02750 Y
BT02741 Y Because of being grilled by the higher
temperature？ the accuracy is not be ensured.
BT01983 Y
BT04565 Y Because of being grilled by the higher
temperature？ the accuracy is not be ensured.
BT03423 Y Because of being grilled by the higher
temperature？ the accuracy is not be ensured.
BT03761 Y Because of being grilled by the higher
temperature？ the accuracy is not be ensured.
HN02809 Y
Y
4 Detailed Assessment of Replacement Component
<Based on the equipment components that need to be replaced, fill out the following table.>
Replacement Component Cost of Component Estimated Labour Estimated Total Cost for Replacing
Hours for Replacing and Repairing Component
Component
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Paste Company Logo here Document: Equipment Assessment Paste Company Logo here Customer: Silian Optoelectronics Date: Paste Company Logo here
<Answer the following questions>
1. Can the refurbishment be done by at Silian’s factory? Y / N
2. If refurbishment cannot be done at Silian’s factory, explain why:
;
;
;
3. If the refurbishment cannot be done at Silian’s factory, how much will shipping cost be? __________
4. Can the refurbishment be done by a Silian Engineers or technicians? Y / N
5. Are there additional costs, such as re-certification costs, decontamination costs, decommissioning costs, etc
associated with this refurbishment? Identify costs and sum up costs: __________ 6. If refurbishment cannot be done by Silian Engineers or technicians, explain why:
;
;
;
The total estimated cost for refurbishing the equipment (add all numbers highlighted in yellow): USD: ____________________
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5 Summary
The Nanite scan head can easily be mounted on any large surface-modifying machine — be in it multi-axial
milling,turning, cutting, grinding, or polishing applications — to monitor the results of the machine’s operation,
regardless of sample size. Nanosurf customers include companies in the watchmaking, imprinting, mechanical device. 6 Appendix
Features:
>Automated: Autonomous operation for multiple measurements via scripting interface and motorized tables >Flexible？Multiple AFM modes, Variety of stages, Scripting interface for programmable analysis and control >Mountable: Mountable onto different translation stages or onto customer’s own instruments
>Large sample: sample size unlimited without stage
>Cantilever alignment chip technology allows for simple tip exchange without adjustment >Dual lens system: top/side view for cantilever and tip make approach and select area easily >Stitching: Combine images to a single large image
Application:
Industry: Surface inspection, augmented Quality Control, Automated measurements
In general: People looking for automated/serial measurements on one or several samples especially big samples
Flexible software:
?Scripting interface allows user-defined data analysis capabilities with Visual Basic script editor ?Automatedly creates professional test report and analysis software enables advanced measurement and analysis, from filting, calibration, tip characteration, force curve analysis, roughness, particle and height analysis ?Automated measurement of image matrixes for very largeAFM images and stiching
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