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SAR

By Glen Boyd,2015-02-01 02:17
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SAR ADC that is configurable to optimize yield Ogawa, T.; Kobayashi, H.; Yohei Tan; Ito, S.; Uemori, S.; Takai, N.; Niitsu, K.; Yamaguchi, T.J.; Matsuura, T.; Ishikawa, N.; Circuits and Systems (APCCAS), 2010 IEEE Asia Pacific Conference on Digital Object Identifier: 10.1109/APCCAS.2010.5774845 Publication Year: 2010 , Page(s): 374 - 377 IEEE Co..
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